Scanning tunneling microscopy of Si(001)

R. J. Hamers, R. M. Tromp, and J. E. Demuth
Phys. Rev. B 34, 5343 – Published 15 October 1986
PDFExport Citation

Abstract

The atomic structure of the Si(001) surface has been examined with use of scanning tunneling microscopy (STM). The STM images reveal a dimer-type reconstruction and are inconsistent with chain and vacancy models. Both buckled and nonbuckled dimers are observed, giving rise to regions of (2×1), c(4×2), and p(2×2) symmetry. The surface has a high density of vacancy-type defects, which appear to induce or stabilize buckling of the dimers at room temperature. The STM images also reveal the atomic structure at steps and defects. At high annealing temperature the step density increases dramatically, eventually leading to faceting.

  • Received 15 May 1986

DOI:https://doi.org/10.1103/PhysRevB.34.5343

©1986 American Physical Society

Authors & Affiliations

R. J. Hamers, R. M. Tromp, and J. E. Demuth

  • IBM Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598

References (Subscription Required)

Click to Expand
Issue

Vol. 34, Iss. 8 — 15 October 1986

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×