Generalized Ramsauer-Townsend effect in extended x-ray-absorption fine structure

A. G. McKale, B. W. Veal, A. P. Paulikas, S.-K. Chan, and G. S. Knapp
Phys. Rev. B 38, 10919 – Published 15 November 1988
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Abstract

Theoretical backscattering amplitude and phase functions, B(k) and φ(k), used in extended x-ray-absorption fine structure (EXAFS) studies show strong features in their k dependence which can be identified as a ‘‘generalized Ramsauer-Townsend effect.’’ This effect is studied in detail for elements with atomic number 78≤Z≤90.

  • Received 4 April 1988

DOI:https://doi.org/10.1103/PhysRevB.38.10919

©1988 American Physical Society

Authors & Affiliations

A. G. McKale, B. W. Veal, A. P. Paulikas, and S.-K. Chan

  • Argonne National Laboratory, Argonne, Illinois 60439

G. S. Knapp

  • Surface Science Instruments, Mountain View, California 94043

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Vol. 38, Iss. 15 — 15 November 1988

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