Raman spectra of c-Si1xGex alloys

M. I. Alonso and K. Winer
Phys. Rev. B 39, 10056 – Published 15 May 1989
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Abstract

We observe several weak features between 420 and 470 cm1 in addition to the normally observed Si-Si (500 cm1), Si-Ge (400 cm1), and Ge-Ge (300 cm1) optic modes in the Raman spectra of Si1xGex (0.28≤x≤0.77) single crystal layers grown by liquid-phase epitaxy (LPE). The quasiequilibrium LPE-growth process rules out the type of long-range ordering recently observed in Si1xGex/Si strained-layer superlattices as the origin for these peaks. Calculations of the first-order Raman spectra of random 216-atom c-Si1xGex alloys reproduce these weak features, which proves that they are not due to second-order Raman processes. Normal-mode analysis shows that they are due to localized Si-Si motion in the neighborhood of one or more Ge atoms. Implications for strain-induced long-range ordering in c-Si1xGex alloys are discussed.

  • Received 15 November 1988

DOI:https://doi.org/10.1103/PhysRevB.39.10056

©1989 American Physical Society

Authors & Affiliations

M. I. Alonso and K. Winer

  • Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, D-7000 Stuttgart 80, Federal Republic of Germany

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Issue

Vol. 39, Iss. 14 — 15 May 1989

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