Microscopic structure of the hydrogen-boron complex in crystalline silicon

P. J. H. Denteneer, C. G. Van de Walle, and S. T. Pantelides
Phys. Rev. B 39, 10809 – Published 15 May 1989
PDFExport Citation

Abstract

The microscopic structure of hydrogen-boron complexes in silicon, which result from the passivation of boron-doped silicon by hydrogen, has been extensively debated in the literature. Most of the debate has focussed on the equilibrium site for the H atom. Here we study the microscopic structure of the complexes using parameter-free total-energy calculations and an exploration of the entire energy surface for H in Si:B. We conclusively show that the global energy minimum occurs for H at a site close to the center of a Si-B bond (BM site), but that there is a barrier of only 0.2 eV for movement of the H atom between four equivalent BM sites. This low energy barrier implies that at room temperature H is able to move around the B atom. Other sites for H proposed by others as the equilibrium sites are shown to be saddle points considerably higher in energy. The vibrational frequency of the H stretching mode at the BM site is calculated and found to be in agreement with experiment. Calculations of the dissociation energy of the complex are discussed.

  • Received 21 November 1988

DOI:https://doi.org/10.1103/PhysRevB.39.10809

©1989 American Physical Society

Authors & Affiliations

P. J. H. Denteneer, C. G. Van de Walle, and S. T. Pantelides

  • IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598

References (Subscription Required)

Click to Expand
Issue

Vol. 39, Iss. 15 — 15 May 1989

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×