• Rapid Communication

Measurement of positron mobility in Si at 30–300 K

J. Mäkinen, C. Corbel, P. Hautojärvi, and D. Mathiot
Phys. Rev. B 43, 12114(R) – Published 15 May 1991
PDFExport Citation

Abstract

The temperature dependence of positron motion in silicon (Si:[P]=4×1014 cm3) is studied experimentally by measuring the drift length of positrons in the space-charge region of an Au-Si surface-barrier diode. At 300 K the positron mobility is 110±15 cm2 V1 s1, and it increases to 2800±1000 cm2 V1 s1 at 30 K. Below 300 K the mobility varies with temperature in accordance with T3/2. This temperature dependence of carrier mobility is typical of scattering from longitudinal-acoustic phonons.

  • Received 14 December 1990

DOI:https://doi.org/10.1103/PhysRevB.43.12114

©1991 American Physical Society

Authors & Affiliations

J. Mäkinen, C. Corbel, and P. Hautojärvi

  • Laboratory of Physics, Helsinki University of Technology, SF-02150 Espoo 15, Finland

D. Mathiot

  • Centre National d’Etudes des Télécommunications, Boîte Postale No. 98, 38243 Meylan CEDEX, France

References (Subscription Required)

Click to Expand
Issue

Vol. 43, Iss. 14 — 15 May 1991

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×