Concentration dependence of optical phonons in the TiO2-SnO2 system

T. Hirata, K. Ishioka, M. Kitajima, and H. Doi
Phys. Rev. B 53, 8442 – Published 1 April 1996
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Abstract

The concentration dependence of optical phonons in the TiO2-SnO2 system whose phase diagram exhibits a miscibility gap, has been studied by Raman scattering and Fourier-transform infrared spectroscopy. X-ray diffraction confirmed that the mixed oxides Ti1xSnxO2 with intervals x=0.1 are a single uniform phase (tetragonal) except some x’s; no phase separation by spinodal decomposition could be avoided for x=0.3, 0.4, 0.5, and 0.6, characterizing x-ray-diffraction profiles by sidebands. The 449 cm1 A1g and 610 cm1 Eg Raman modes for TiO2 never changed linearly in frequency and linewidth with x. It is stressed that the x dependence of optical phonons is predominated by the octahedral distortion in Ti1xSnxO2, where different/anisotropic compressibilities and thermal expansivities of each end member play a crucial role. Infrared-reflectance spectra consisting of the infrared-active A2u and Eu modes between 50–900 cm1, also changed systematically with x in Ti1xSnxO2. The concentration dependence of optical phonons in Ti1xSnxO2 is discussed, from the viewpoint of the mode behavior of mixed crystals. © 1996 The American Physical Society.

  • Received 17 August 1995

DOI:https://doi.org/10.1103/PhysRevB.53.8442

©1996 American Physical Society

Authors & Affiliations

T. Hirata, K. Ishioka, M. Kitajima, and H. Doi

  • National Research Institute for Metals, 1-2-1, Sengen, Tsukuba, Ibaraki 305, Japan

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Issue

Vol. 53, Iss. 13 — 1 April 1996

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