Phys. Rev. B 54, 7716 (1996) - Nonlocal screening effects in 2p x-ray photoemission spectroscopy of NiO (100)

Nonlocal screening effects in 2p x-ray photoemission spectroscopy of NiO (100)

D. Alders, F. C. Voogt, T. Hibma, and G. A. Sawatzky

Phys. Rev. B 54, 7716 – Published 15 September 1996

Abstract

We report on the layer thickness dependence of Ni 2p core-level line shapes of epitaxially grown, in a layer-by-layer fashion, NiO on a single-crystal MgO (100) substrate. The results demonstrate the sensitivity of the core-level line shape to the nearest as well as next-nearest-neighbor coordination number. The results are consistent with a recent theoretical study of nonlocal screening effects. © 1996 The American Physical Society.

Received 1 March 1996

DOI:https://doi.org/10.1103/PhysRevB.54.7716

©1996 American Physical Society

Authors & Affiliations

Department of Applied and Solid State Physics, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands

F. C. Voogt and T. Hibma

Department of Chemical Physics, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands

Department of Applied and Solid State Physics, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands

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Vol. 54, Iss. 11 — 15 September 1996

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