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Electric-field and temperature dependence of the hole mobility in poly(p-phenylene vinylene)

P. W. M. Blom, M. J. M. de Jong, and M. G. van Munster
Phys. Rev. B 55, R656(R) – Published 1 January 1997
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Abstract

The current-voltage characteristics of poly(dialkoxy p-phenylene vinylene)-based hole-only devices are measured as a function of temperature. The hole current is space-charge limited, which provides a direct measurement of the hole mobility μp as a function of electric field E and temperature. The hole mobility exhibits a field dependence ln μpE as has also been observed from time-of-flight experiments in many molecularly doped polymers and amorphous glasses. For the zero-field hole mobility an activation energy of 0.48 eV is obtained. The combination of a field-dependent mobility and space-charge effects provides a consistent description of the hole conduction in conjugated polymer films as a function of voltage, temperature, and layer thickness.

    DOI:https://doi.org/10.1103/PhysRevB.55.R656

    ©1997 American Physical Society

    Authors & Affiliations

    P. W. M. Blom, M. J. M. de Jong, and M. G. van Munster

    • Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands

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    Vol. 55, Iss. 2 — 1 January 1997

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