Size-dependent near-infrared photoluminescence from Ge nanocrystals embedded in SiO2 matrices

Shinji Takeoka, Minoru Fujii, Shinji Hayashi, and Keiichi Yamamoto
Phys. Rev. B 58, 7921 – Published 15 September 1998
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Abstract

We have succeeded in observing the size dependent photoluminescence (PL) from Ge nanocrystals (nc-Ge) with 0.9–5.3 nm in average diameter (dave) in the near-infrared region. The nc-Ge were fabricated by rf cosputtering of Ge and SiO2 and post annealing at 800°C. It was found that the sample with dave=5.3nm shows a PL peak at about 0.88 eV. With decreasing the size, the PL peak shifted to higher energies and reached 1.54 eV for the sample with dave=0.9nm. It was also found that the PL intensity increases drastically with decreasing the size. The observed strong size dependence of the PL spectra indicates that the observed PL originates from the recombination of electron-hole pairs confined in nc-Ge.

  • Received 22 January 1998

DOI:https://doi.org/10.1103/PhysRevB.58.7921

©1998 American Physical Society

Authors & Affiliations

Shinji Takeoka

  • Division of Electrical and Electronics Engineering, The Graduate School of Science and Technology, Kobe University, Rokkodai, Nada, Kobe 657, Japan

Minoru Fujii*, Shinji Hayashi, and Keiichi Yamamoto

  • Department of Electrical and Electronics Engineering, Faculty of Engineering, Kobe University, Rokkodai, Nada, Kobe 657, Japan

  • *Author to whom correspondence should be addressed. Electronic address: fujii@eedept.kobe-u.ac.jp

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Vol. 58, Iss. 12 — 15 September 1998

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