Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2

Y. Harada, T. Kinugasa, R. Eguchi, M. Matsubara, A. Kotani, M. Watanabe, A. Yagishita, and S. Shin
Phys. Rev. B 61, 12854 – Published 15 May 2000
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Abstract

Polarization dependence of soft-x-ray Raman scattering was investigated at the Ti 2p absorption edge of TiO2. Strong Raman scattering feature appears about 14 eV below elastic peaks with strong polarization dependence. These Raman scattering structures are charge transfer excitations to the antibonding state between 3d1L1 and 3d0 states, because they are enhanced when the incident photon energies are tuned at satellite structures of Ti 2p absorption spectrum. Broad Raman scattering structures are found between 3 eV and 10 eV below elastic peaks. They are assigned to be nonbonding type charge transfer excitations or interband transition from O 2p valence to Ti 3d conduction bands, which includes the crystal field splitting in D2h symmetry with two Ti-O bond lengths.

  • Received 18 October 1999

DOI:https://doi.org/10.1103/PhysRevB.61.12854

©2000 American Physical Society

Authors & Affiliations

Y. Harada, T. Kinugasa, R. Eguchi, M. Matsubara, and A. Kotani

  • Institute for Solid State Physics, University of Tokyo, Minato-ku, Tokyo 106-8666, Japan

M. Watanabe and A. Yagishita

  • Photon Factory, Institute of Materials Structure Science, Tsukuba, Ibaraki 305-0801, Japan

S. Shin

  • Institute for Solid State Physics, University of Tokyo, Minato-ku, Tokyo 106-8666, Japan
  • The Institute of Physical and Chemical Research (RIKEN), Sayo-gun, Hyogo 679-5143, Japan

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Vol. 61, Iss. 19 — 15 May 2000

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