Real-time imaging of atomistic process in one-atom-thick metal junctions

V. Rodrigues and D. Ugarte
Phys. Rev. B 63, 073405 – Published 26 January 2001
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Abstract

We present an in situ and time resolved high-resolution transmission electron microscopy study of the atomistic process during the last elongation stages of gold nanojunctions. In particular, we concentrate on suspended chains of atoms, which have shown to be remarkably stable, although they present rather long bonds (3.0–3.6 Å). One-atom-thick junctions are robust, but their attachment points move rather easily on the metal surface, allowing the accommodation of apex movements or rotations.

  • Received 14 August 2000

DOI:https://doi.org/10.1103/PhysRevB.63.073405

©2001 American Physical Society

Authors & Affiliations

V. Rodrigues1,2 and D. Ugarte1,*

  • 1Laboratório Nacional de Luz Síncrotron, Caixa Postal 6192, 13084-971 Campinas SP, Brazil
  • 2Intituto de Física Gleb Wathagin, UNICAMP, Caixa Postal 6161, 13083-970 Campinas SP, Brazil

  • *Email address: Author to whom correspondence should be addressed: ugarte@lnls.br

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Vol. 63, Iss. 7 — 15 February 2001

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