Multiple aging mechanisms in relaxor ferroelectrics

Eugene V. Colla, Lambert K. Chao, and M. B. Weissman
Phys. Rev. B 63, 134107 – Published 7 March 2001
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Abstract

In three relaxor ferroelectrics strong low-field aging effects are found for the dielectric susceptibility. Different regimes, marked by different time dependence and by different stability under subsequent thermal cycles and field changes, are found in different materials and at different temperatures. One regime strongly resembles aging in spin glasses, but others do not.

  • Received 16 October 2000

DOI:https://doi.org/10.1103/PhysRevB.63.134107

©2001 American Physical Society

Authors & Affiliations

Eugene V. Colla, Lambert K. Chao, and M. B. Weissman

  • Department of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801-3080

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Issue

Vol. 63, Iss. 13 — 1 April 2001

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