Ideal unreactive metal/semiconductor interfaces: The case of Zn/ZnSe(001)

S. Rubini, E. Pelucchi, M. Lazzarino, D. Kumar, A. Franciosi, C. Berthod, N. Binggeli, and A. Baldereschi
Phys. Rev. B 63, 235307 – Published 18 May 2001
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Abstract

Zn/ZnSe(001) interfaces fabricated by metal deposition at room temperature onto ZnSe(001) c(2×2), 2×1, and 1×1 surfaces were studied by means of x-ray photoemission spectroscopy and current-voltage and capacitance-voltage measurements. All junctions exhibited an ideal unreactive behavior and an identical Schottky barrier height of 1.85 eV (for p-type conduction). Ab initio pseudopotential calculations for model interface configurations provide a microscopic explanation of the different behavior of Zn/ZnSe junctions as compared to Al/ZnSe and Au/ZnSe junctions.

  • Received 21 December 2000

DOI:https://doi.org/10.1103/PhysRevB.63.235307

©2001 American Physical Society

Authors & Affiliations

S. Rubini, E. Pelucchi, M. Lazzarino, D. Kumar*, and A. Franciosi

  • Laboratorio Nazionale TASC-INFM, Area Science Park, Building MM, S.S. 14, Km. 163.5, I-34012 Trieste, Italy

C. Berthod, N. Binggeli, and A. Baldereschi§

  • Institut de Physique Appliquée, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland

  • *Present address: Electronic Science Department, Kurukshetra University, 136119 India.
  • Also with Dipartimento di Fisica, Università di Trieste, I-34127 Trieste, Italy.
  • Present address: DPMC, Université de Genève, 24 Quai Ernest-Ansermet, 1221 Genève 4, Switzerland.
  • §Also with Dipartimento di Fisica Teorica and INFM, Università di Trieste, I-34014 Trieste, Italy.

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Issue

Vol. 63, Iss. 23 — 15 June 2001

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