Spectroscopic determination of hole density in the ferromagnetic semiconductor Ga1xMnxAs

M. J. Seong, S. H. Chun, H. M. Cheong, N. Samarth, and A. Mascarenhas
Phys. Rev. B 66, 033202 – Published 3 July 2002
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Abstract

A measurement of the hole density in the ferromagnetic semiconductor Ga1xMnxAs is notoriously difficult using standard transport techniques due to the dominance of the anomalous Hall effect. Here we report a spectroscopic measurement of the hole density in four Ga1xMnxAs samples (x=0,0.038, 0.061, and 0.083) at room temperature using a Raman-scattering intensity analysis of the coupled plasmon–LO-phonon mode and the unscreened LO phonon. The unscreened LO-phonon frequency linearly decreases as the Mn concentration increases up to 8.3%. The hole density determined from the Raman scattering shows a monotonic increase with increasing x for x<~0.083, exhibiting a direct correlation to the observed Tc. The optical technique reported here provides an unambiguous means of determining the hole density in this important class of “spintronic” semiconductor materials.

  • Received 8 May 2002

DOI:https://doi.org/10.1103/PhysRevB.66.033202

©2002 American Physical Society

Authors & Affiliations

M. J. Seong1,*, S. H. Chun2, H. M. Cheong1,3, N. Samarth2, and A. Mascarenhas1

  • 1National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden, Colorado 80401
  • 2Department of Physics and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802
  • 3Department of Physics, Sogang University, Seoul 121-742, Korea

  • *Corresponding author. Email address: mseong@nrel.gov

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Vol. 66, Iss. 3 — 15 July 2002

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