Abstract
A measurement of the hole density in the ferromagnetic semiconductor is notoriously difficult using standard transport techniques due to the dominance of the anomalous Hall effect. Here we report a spectroscopic measurement of the hole density in four samples 0.061, and 0.083) at room temperature using a Raman-scattering intensity analysis of the coupled plasmon–LO-phonon mode and the unscreened LO phonon. The unscreened LO-phonon frequency linearly decreases as the Mn concentration increases up to 8.3%. The hole density determined from the Raman scattering shows a monotonic increase with increasing x for exhibiting a direct correlation to the observed The optical technique reported here provides an unambiguous means of determining the hole density in this important class of “spintronic” semiconductor materials.
- Received 8 May 2002
DOI:https://doi.org/10.1103/PhysRevB.66.033202
©2002 American Physical Society