Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface

A. S. Foster, O. H. Pakarinen, J. M. Airaksinen, J. D. Gale, and R. M. Nieminen
Phys. Rev. B 68, 195410 – Published 18 November 2003
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Abstract

In this study we simulate noncontact atomic force microscopy imaging of the TiO2 (110) surface using first-principles and atomistic methods. We use three different tip models to investigate the tip-surface interaction on the ideal surface, and find that agreement with experiment is found for either a silicon tip or a tip with a net positive electrostatic potential from the apex. Both predict bright contrast over the bridging oxygen rows. We then study the interaction of this tip with a bridging oxygen vacancy on the surface, and find that the much weaker interaction observed would result in vacancies appearing as dark contrast along the bright rows in images.

  • Received 20 August 2003

DOI:https://doi.org/10.1103/PhysRevB.68.195410

©2003 American Physical Society

Authors & Affiliations

A. S. Foster1,*, O. H. Pakarinen1, J. M. Airaksinen1, J. D. Gale2, and R. M. Nieminen1

  • 1Laboratory of Physics, Helsinki University of Technology, P.O. Box 1100, 02015 Helsinki, Finland
  • 2Department of Chemistry, Imperial College London, South Kensington SW7 2AZ, United Kingdom

  • *Electronic address: asf@fyslab.hut.fi; www.fyslab.hut.fi/∼asf/physics/Physics.html

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Vol. 68, Iss. 19 — 15 November 2003

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