Unified particle approach to Wigner-Boltzmann transport in small semiconductor devices

M. Nedjalkov, H. Kosina, S. Selberherr, C. Ringhofer, and D. K. Ferry
Phys. Rev. B 70, 115319 – Published 23 September 2004

Abstract

Small semiconductor devices can be separated into regions where the electron transport has classical character, neighboring with regions where the transport requires a quantum description. The classical transport picture is associated with Boltzmann-like particles that evolve in the phase-space defined by the wave vector and real space coordinates. The evolution consists of consecutive processes of drift over Newton trajectories and scattering by phonons. In the quantum regions, a convenient description of the transport is given by the Wigner-function formalism. The latter retains most of the basic classical notions, particularly, the concepts for phase-space and distribution function, which provide the physical averages. In this work we show that the analogy between classical and Wigner transport pictures can be even closer. A particle model is associated with the Wigner-quantum transport. Particles are associated with a sign and thus become positive and negative. The sign is the only property of the particles related to the quantum information. All other aspects of their behavior resemble Boltzmann-like particles. The sign is taken into account in the evaluation of the physical averages. The sign has a physical meaning because positive and negative particles that meet in the phase space annihilate one another. The Wigner and Boltzmann transport pictures are explained in a unified way by the processes drift, scattering, generation, and recombination of positive and negative particles. The model ensures a seamless transition between the classical and quantum regions. A stochastic method is derived and applied to simulation of resonant-tunneling diodes. Our analysis shows that the method is useful if the physical quantities do not vary over several orders of magnitude inside a device.

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  • Received 20 March 2004

DOI:https://doi.org/10.1103/PhysRevB.70.115319

©2004 American Physical Society

Authors & Affiliations

M. Nedjalkov1,2, H. Kosina2, S. Selberherr2, C. Ringhofer3, and D. K. Ferry1

  • 1Department of Electrical Engineering, Center for Solid State Electronics Research, Arizona State University, Tempe, Arizona 85287-1804, USA
  • 2Institute for Microlectronics, TU-Vienna, Gusshausstrasse 27-29, E360 A-1040, Vienna, Austria
  • 3Department of Mathematics, Arizona State University, Tempe, Arizona 85287-1804, USA

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Issue

Vol. 70, Iss. 11 — 15 September 2004

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