Charge fluctuations and concentration fluctuations at intermediate-range distances in the disordered network-forming materials SiO2, SiSe2, and GeSe2

Carlo Massobrio, Massimo Celino, and Alfredo Pasquarello
Phys. Rev. B 70, 174202 – Published 9 November 2004

Abstract

We calculate the concentration-concentration partial structure factor SCC(k) and the charge-charge structure factor Szz(k) of liquid SiO2, amorphous SiSe2 and liquid GeSe2 using first-principles molecular dynamics. These systems are characterized by the occurrence of intermediate range order, as evidenced by a first sharp diffraction peak (FSDP) at low k values in the total neutron structure factor. We show that a FSDP in the concentration-concentration partial structure factor SCC(k) is generally associated with a small departure from chemical order. This feature tends to vanish either when sufficiently high levels of structural disorder set in, or, oppositely, when the chemical order is essentially perfect. For none of these networks, a FSDP is observed in the charge-charge structure factor Szz(k), i.e., fluctuations of charge do not occur over intermediate range distances. The constraint of charge neutrality is at the very origin of the appearance of fluctuations of concentration. These are observed when the atoms occur in configurations with different coordinations.

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  • Received 18 December 2003

DOI:https://doi.org/10.1103/PhysRevB.70.174202

©2004 American Physical Society

Authors & Affiliations

Carlo Massobrio1, Massimo Celino2, and Alfredo Pasquarello3,4

  • 1Institut de Physique et de Chimie des Matériaux de Strasbourg, 23 rue du Loess, BP43, F-67034 Strasbourg Cedex 2, France
  • 2Ente per le Nuove Tecnologie, l’Energia e l’Ambiente, ENEA, C.R. Casaccia, CP 2400, I-00100 Roma, Italy and Istituto Nazionale per la Fisica della Materia, Unità di Ricerca Roma1, Italy
  • 3Institut de Théorie des Phénomènes Physiques (ITP), Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
  • 4Institut Romand de Recherche Numérique en Physique des Matériaux (IRRMA), CH-1015 Lausanne, Switzerland

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Issue

Vol. 70, Iss. 17 — 1 November 2004

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