Conservative and dissipative force imaging of switchable rotaxanes with frequency-modulation atomic force microscopy

Alan A. Farrell, Takeshi Fukuma, Takayuki Uchihashi, Euan R. Kay, Giovanni Bottari, David A. Leigh, Hirofumi Yamada, and Suzanne P. Jarvis
Phys. Rev. B 72, 125430 – Published 23 September 2005

Abstract

We compare constant amplitude frequency modulation atomic force microscopy (FM-AFM) in ambient conditions to ultrahigh vacuum (UHV) experiments by analysis of thin films of rotaxane molecules. Working in ambient conditions is important for the development of real-world molecular devices. We show that the FM-AFM technique allows quantitative measurement of conservative and dissipative forces without instabilities caused by any native water layer. Molecular resolution is achieved despite the low Q-factor in the air. Furthermore, contrast in the energy dissipation is observed even at the molecular level. This should allow investigations into stimuli-induced sub-molecular motion of organic films.

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  • Received 27 May 2005

DOI:https://doi.org/10.1103/PhysRevB.72.125430

©2005 American Physical Society

Authors & Affiliations

Alan A. Farrell1,*, Takeshi Fukuma2, Takayuki Uchihashi1, Euan R. Kay3, Giovanni Bottari3, David A. Leigh3,†, Hirofumi Yamada2, and Suzanne P. Jarvis1

  • 1Nanoscale Function Group, Centre for Research on Adaptive Nanostructures and Nanodevices, University of Dublin, Trinity College, Dublin 2, Ireland
  • 2Department of Electronic Science and Engineering, Kyoto University A1-326, Katsura, Nishikyo, Kyoto 615-8510, Japan
  • 3School of Chemistry, University of Edinburgh, The King’s Buildings, West Mains Road, Edinburgh EH9 3JJ, UK

  • *Author to whom correspondence should be addressed. Email address: farrelaa@tcd.ie
  • Email address: David.Leigh@ed.ac.uk

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Issue

Vol. 72, Iss. 12 — 15 September 2005

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