Structural and electronic properties of Fe3+ and Fe2+ centers in GaN from optical and EPR experiments

E. Malguth, A. Hoffmann, W. Gehlhoff, O. Gelhausen, M. R. Phillips, and X. Xu
Phys. Rev. B 74, 165202 – Published 3 October 2006

Abstract

This work provides a consistent picture of the structural, optical, and electronic properties of Fe-doped GaN. A set of high-quality GaN crystals doped with Fe at concentrations ranging from 5×1017cm3to2×1020cm3 is systematically investigated by means of electron paramagnetic resonance and various optical techniques. Fe3+ is shown to be a stable charge state at concentrations from 1×1018cm3. The fine structure of its midgap states is successfully established, including an effective-mass-like state consisting of a hole bound to Fe2+ with a binding energy of 50±10meV. A major excitation mechanism of the Fe3+(T14A16) luminescence is identified to be the capture of free holes by Fe2+ centers. The holes are generated in a two-step process via the intrinsic defects involved in the yellow luminescence. The Fe3+2+ charge-transfer level is found 2.863±0.005eV above the valence band, suggesting that the internal reference rule does not hold for the prediction of band offsets of heterojunctions between GaN and other III-V materials. The Fe2+(E5T25) transition is observed around 390meV at any studied Fe concentration by means of Fourier transform infrared spectroscopy. Charge-transfer processes and the effective-mass-like state involving both Fe2+ states are observed. At Fe concentrations from 1×1019cm3, additional lines occur in electron paramagnetic resonance and photoluminescence spectra which are attributed to defect complexes involving Fe3+. With increasing Fe concentration, the Fermi level is shown to move from near the conduction band to the Fe3+2+ charge-transfer level, where it stays pinned for concentrations from 1×1019cm3. Contrary to cubic II-VI and III-V materials, both electronic states are effected by only a weak Jahn-Teller interaction.

    • Received 26 May 2006

    DOI:https://doi.org/10.1103/PhysRevB.74.165202

    ©2006 American Physical Society

    Authors & Affiliations

    E. Malguth*, A. Hoffmann, and W. Gehlhoff

    • Institut für Festkörperphysik, Technische Universität Berlin, Hardenbergstraße 36, 10623 Berlin, Germany

    O. Gelhausen and M. R. Phillips

    • Microstructural Analysis Unit, University of Technology, Sydney, Broadway, NSW 2007 Australia

    X. Xu

    • Cree, Inc., 4600 Silicon Drive, Durham, North Carolina 27703, USA

    • *Corresponding author. Present address: Microstructural Analysis Unit, University of Technology, Sydney, Australia. Electronicaddress: Malguth@physik.tu-berlin.de
    • Present address: WS Materials Technology, LLC, 15 Central St., Stamford, CT 06906, USA.

    See Also

    Internal E5T25 transition of Fe2+ in GaN

    E. Malguth, A. Hoffmann, and X. Xu
    Phys. Rev. B 74, 165201 (2006)

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    Issue

    Vol. 74, Iss. 16 — 15 October 2006

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