Dielectric relaxation of suspensions of nanoscale particles surrounded by a thick electric double layer

Kongshuang Zhao and Kejuan He
Phys. Rev. B 74, 205319 – Published 16 November 2006

Abstract

Dielectric relaxations of suspensions of nanoscale silica particles surrounded by a thick electric double layer are investigated to examine the effect of the concentration of particles. It is found that at low concentrations, the low-frequency dispersion gradually merges with the high-frequency one to become a broad dispersion. The relaxation mechanisms are discussed by using the observed relaxation time. The low-frequency dispersion is caused by the electric double layer polarization while the high-frequency dispersion results from the interfacial polarization. The inner characteristics of the dispersed particles and the dispersing media are obtained from a two-step analytical method developed by the authors [K. He and K. Zhao, Langmuir 21, 11878 (2005)]. With the results of the analysis, Hill’s standard electrokinetic model is employed to interpret the merging of the low- and high-frequency dispersions. The discrepancy between the experimentally observed χa and that derived from the model estimation is preliminarily explained by the overlap of an electric double layer.

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  • Received 10 April 2006

DOI:https://doi.org/10.1103/PhysRevB.74.205319

©2006 American Physical Society

Authors & Affiliations

Kongshuang Zhao* and Kejuan He

  • College of Chemistry, Beijing Normal University, Beijing 100875, China

  • *Author to whom correspondence should be addressed.

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Issue

Vol. 74, Iss. 20 — 15 November 2006

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