Diameter-dependent thermopower of bismuth nanowires

A. Nikolaeva, T. E. Huber, D. Gitsu, and L. Konopko
Phys. Rev. B 77, 035422 – Published 18 January 2008

Abstract

We present a study of electronic transport in individual Bi nanowires of large diameter relative to the Fermi wavelength. Measurements of the resistance and thermopower of intrinsic and Sn-doped Bi wires with various wire diameters, ranging from 150to480nm, have been carried out over a wide range of temperatures (4300K) and magnetic fields (014T). We find that the thermopower of intrinsic Bi wires in this diameter range is positive (type p) below about 150K, displaying a peak at around 40K. In comparison, intrinsic bulk Bi is type n. Magnetothermopower effects due to the decrease of surface scattering when the cyclotron diameter is less than the wire diameter are demonstrated. The measurements are interpreted in terms of a model of diffusive thermopower, where the mobility limitations posed by hole-boundary scattering are much less severe than those due to electron-boundary scattering.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
5 More
  • Received 7 July 2007

DOI:https://doi.org/10.1103/PhysRevB.77.035422

©2008 American Physical Society

Authors & Affiliations

A. Nikolaeva1,2, T. E. Huber3, D. Gitsu1, and L. Konopko1

  • 1Institute of Applied Physics, Academy of Sciences of Moldova, Chisinau MD-2028, Moldova
  • 2International Laboratory of High Magnetic Fields and Low Temperatures, Wroclav 53-421, Poland
  • 3Department of Chemistry, Howard University, 525 College Street NW, Washington, DC 20059, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 77, Iss. 3 — 15 January 2008

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×