Continuous-wave and ultrafast coherent reflectivity studies of excitons in bulk GaN

O. Aoudé, P. Disseix, J. Leymarie, A. Vasson, M. Leroux, E. Aujol, B. Beaumont, A. Trassoudaine, and Y. André
Phys. Rev. B 77, 045206 – Published 16 January 2008

Abstract

We report an extensive study of the excitonic properties of freestanding and heteroepitaxial GaN samples using continuous-wave reflectivity and time-resolved autocorrelation measurements. The coherent impulse response of free excitons is recorded by using an interferometric correlation technique. Excitonic parameters of GaN are deduced from the combined analysis of both experiments. Oscillator strengths and transition energies are studied as a function of the residual biaxial strain of the sample and temperature-dependent measurements are used to determine the parameters of the exciton-phonon interaction in GaN.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 21 December 2006

DOI:https://doi.org/10.1103/PhysRevB.77.045206

©2008 American Physical Society

Authors & Affiliations

O. Aoudé1, P. Disseix1, J. Leymarie1, A. Vasson1, M. Leroux2, E. Aujol3, B. Beaumont3, A. Trassoudaine1, and Y. André1

  • 1LASMEA UMR 6602 UBP/CNRS, 24 Avenue des Landais, F-63177 Aubière Cedex, France
  • 2CRHEA-CNRS, Rue Bernard Grégory, 06560 Valbonne, France
  • 3LUMILOG, 2720 Chemin de Saint Bernard, F-06222 Vallauris, France

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 77, Iss. 4 — 15 January 2008

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×