Crystalline GeTe-based phase-change alloys: Disorder in order

Milos Krbal, Alexander V. Kolobov, Paul Fons, Junji Tominaga, S. R. Elliott, J. Hegedus, A. Giussani, K. Perumal, R. Calarco, T. Matsunaga, N. Yamada, K. Nitta, and T. Uruga
Phys. Rev. B 86, 045212 – Published 23 July 2012; Errata Phys. Rev. B 86, 079910 (2012); Phys. Rev. B 91, 079902 (2015)

Abstract

Through the combined use of x-ray absorption and scattering experiments and ab initio simulations, we demonstrate that the metastable cubic phase of GeTe-based phase-change alloys, e.g. Ge2Sb2Te5, is significantly more disordered than is generally believed, with a large number of Ge atoms located off octahedral resonantly bonded sites. The stochastic off-octahedral locations of Ge atoms, that are invisible to Bragg diffraction probing the average structure, lead to disruption of the continuous resonance bonding network of the crystalline phase, resulting in localization of charge carriers. It is proposed that the degree of coherency of local rhombohedral displacements, that may be varied, e.g., by doping, can serve as means to control electrical properties of Ge-Sb-Te alloys.

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  • Received 21 March 2012
  • Corrected 6 August 2012

DOI:https://doi.org/10.1103/PhysRevB.86.045212

©2012 American Physical Society

Corrections

6 August 2012

Errata

Publisher's Note: Crystalline GeTe-based phase-change alloys: Disorder in order [Phys. Rev. B 86, 045212 (2012)]

Milos Krbal, Alexander V. Kolobov, Paul Fons, Junji Tominaga, S. R. Elliott, J. Hegedus, A. Giussani, K. Perumal, R. Calarco, T. Matsunaga, N. Yamada, K. Nitta, and T. Uruga
Phys. Rev. B 86, 079910 (2012)

Erratum: Crystalline GeTe-based phase-change alloys: Disorder in order [Phys. Rev. B 86, 045212 (2012)]

Milos Krbal, Alexander V. Kolobov, Paul Fons, Junji Tominaga, S. R. Elliott, J. Hegedus, A. Giussani, K. Perumal, R. Calarco, T. Matsunaga, N. Yamada, K. Nitta, and T. Uruga
Phys. Rev. B 91, 079902 (2015)

Authors & Affiliations

Milos Krbal, Alexander V. Kolobov*, Paul Fons, and Junji Tominaga

  • Nanodevice Innovation Research Center, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 4, Higashi 1-1-1, Tsukuba, Ibaraki 305-8562, Japan

S. R. Elliott

  • Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge, CB2 1EW United Kingdom

J. Hegedus

  • COMP/Department of Applied Physics, Aalto University School of Science, P.O. Box 11100, FI-00076 Aalto, Finland

A. Giussani, K. Perumal, and R. Calarco

  • Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, 10117 Berlin, Germany

T. Matsunaga

  • Material & Process Development Center, Panasonic Corporation 3-1-1 Yagumo-Nakamachi, Moriguchi, Osaka 570-8501, Japan

N. Yamada

  • Advanced Technology Research Laboratories, Panasonic Corporation 3-4 Hikari-dai Seika-cho, Kyoto, 619-0237, Japan

K. Nitta and T. Uruga

  • Japan Synchrotron Radiation Research Institute, 1-1-1 Koto, Sayo, Hyogo 679-5198, Japan

  • *a.kolobov@aist.go.jp

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Issue

Vol. 86, Iss. 4 — 15 July 2012

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