Determination of crystallite size in polished graphitized carbon by Raman spectroscopy

O. A. Maslova, M. R. Ammar, G. Guimbretière, J.-N. Rouzaud, and P. Simon
Phys. Rev. B 86, 134205 – Published 31 October 2012

Abstract

A series of polished and unpolished sp2-nanostructured carbons “nanographites” obtained from the pyrolysis of various precursor types have been systematically studied by both Raman spectroscopy and x-ray diffraction. The ratio between the intensities of the disorder-induced D band and the first-order graphite G band (ID/IG) commonly used up to now to estimate the “crystallite” diameter La displays, in the case of polished graphitized sp2 carbons, clear spatial heterogeneities and can lead to the overestimation of the intrinsic structural disorder. The full width at half maximum of the G band, which is shown to be insensitive to the polishing process, exhibits a linear dependence on the mean “crystallite” diameter [FWHM(G) = 14 + 430/La] and therefore can be used for an accurate structural characterization of these nanographites.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 19 July 2012

DOI:https://doi.org/10.1103/PhysRevB.86.134205

©2012 American Physical Society

Authors & Affiliations

O. A. Maslova1,2, M. R. Ammar1,2,*, G. Guimbretière1,2, J.-N. Rouzaud3, and P. Simon1,2

  • 1CNRS, UPR 3079 CEMHTI, 45071 Orléans Cedex 2, France
  • 2Université d’Orléans, Polytech’Orléans, 45072 Orléans Cedex 2, France
  • 3Laboratoire de Géologie de l’Ecole Normale Supérieure, CNRS-ENS UMR 8538, 75231 Paris Cedex 5, France

  • *mammar@cnrs-orleans.fr

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 86, Iss. 13 — 1 October 2012

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×