Electron localization in inhomogeneous Möbius rings

V. M. Fomin, S. Kiravittaya, and O. G. Schmidt
Phys. Rev. B 86, 195421 – Published 19 November 2012

Abstract

The effects of inhomogeneity on the electron states in semiconductor Möbius rings at the microscale are theoretically investigated. Effective electron localization in the untwisted part of an inhomogeneous Möbius ring is caused by a change of the electron quantized kinetic energy. We suggest an experimental method to detect the electron localization by measuring persistent currents in inhomogeneous Möbius rings.

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  • Received 8 July 2012

DOI:https://doi.org/10.1103/PhysRevB.86.195421

©2012 American Physical Society

Authors & Affiliations

V. M. Fomin1, S. Kiravittaya1,2, and O. G. Schmidt1,3

  • 1Institute for Integrative Nanosciences, IFW-Dresden, Helmholtzstrasse 20, D-01069 Dresden, Germany
  • 2Department of Electrical and Computer Engineering, Faculty of Engineering, Naresuan University, Phitsanulok 65000, Thailand
  • 3Material Systems for Nanoelectronics, Chemnitz University of Technology, Reichenhainer Strasse 70, D-09107 Chemnitz, Germany

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Issue

Vol. 86, Iss. 19 — 15 November 2012

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