Abstract
The effects of inhomogeneity on the electron states in semiconductor Möbius rings at the microscale are theoretically investigated. Effective electron localization in the untwisted part of an inhomogeneous Möbius ring is caused by a change of the electron quantized kinetic energy. We suggest an experimental method to detect the electron localization by measuring persistent currents in inhomogeneous Möbius rings.
- Received 8 July 2012
DOI:https://doi.org/10.1103/PhysRevB.86.195421
©2012 American Physical Society