R. K. Vasudevan^1,*,†, M. B. Okatan^1,*,†, Y. Y. Liu², S. Jesse³, J.-C. Yang⁴, W.-I. Liang⁴, Y.-H. Chu⁴, J. Y. Li⁵, S. V. Kalinin^3,‡, and V. Nagarajan^1,§

• ¹School of Materials Science and Engineering, University of New South Wales, Kensington 2052, Australia
• ²Faculty of Materials, Optoelectronics and Physics, and Key Laboratory of Low Dimensional Materials & Application Technology of Ministry of Education, Xiangtan University, Xiangtan, Hunan 411105, China
• ³The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
• ⁴Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan
• ⁵Department of Mechanical Engineering, University of Washington, Seattle, Washington 98195-600, USA

• ^*Current address: The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
• ^†These two authors contributed equally to the manuscript.
• ^‡sergei2@ornl.gov
• ^§nagarajan@unsw.edu.au