Mechanism of excitonic dephasing in layered InSe crystals

P. Dey, J. Paul, N. Glikin, Z. D. Kovalyuk, Z. R. Kudrynskyi, A. H. Romero, and D. Karaiskaj
Phys. Rev. B 89, 125128 – Published 31 March 2014

Abstract

The dephasing and lifetime of excitons in InSe layered crystals are carefully measured using three-pulse, four-wave mixing and two-dimensional Fourier transform (2DFT) spectroscopy. We obtain a detailed picture of the mechanism of excitonic dephasing in this layered material. The 2DFT spectra reveal contributions from the coherent excitation of continuum states, whereas the temperature dependence provides a detailed description of the phonon-exciton interactions and the low temperature limit of the homogeneous linewidth. The excitation density dependence reveals excitation-induced dephasing due to exciton-exciton scattering. The temperature-dependent homogeneous linewidth is dominated by the interaction of excitons with the 113 cm1 out-of-plane phonon mode.

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  • Received 12 November 2013
  • Revised 3 March 2014

DOI:https://doi.org/10.1103/PhysRevB.89.125128

©2014 American Physical Society

Authors & Affiliations

P. Dey1, J. Paul1, N. Glikin1, Z. D. Kovalyuk2, Z. R. Kudrynskyi2, A. H. Romero3, and D. Karaiskaj1,*

  • 1Department of Physics, University of South Florida, 4202 East Fowler Avenue, Tampa, Florida 33620, USA
  • 2Frantsevich Institute of Material Sciences Problems, National Academy of Sciences of Ukraine, Chernivtsi Department, 5 Iryna Vilde Str., 58001 Chernivtsi, Ukraine
  • 3Physics Department, West Virginia University, Morgantown, West Virginia 26506-6315, USA

  • *karaiskaj@usf.edu

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Vol. 89, Iss. 12 — 15 March 2014

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