Use of x-ray scattering functions in Kramers-Kronig analysis of reflectance

D. B. Tanner
Phys. Rev. B 91, 035123 – Published 21 January 2015

Abstract

Kramers-Kronig analysis is commonly used to estimate the optical properties of new materials. The analysis typically uses data from far infrared through near ultraviolet (say 40–40000cm1 or 5 meV–5 eV) and uses extrapolations outside the measured range. Most high-frequency extrapolations use a power law, 1/ωn, transitioning to 1/ω4 at a considerably higher frequency and continuing this free-carrier extension to infinity. The midrange power law is adjusted to match the slope of the data and to give pleasing curves, but the choice of power (usually between 0.5 and 3) is arbitrary. Instead of an arbitrary power law, it is better to use x-ray atomic scattering functions such as those presented by Henke and co-workers. These basically treat the solid as a linear combination of its atomic constituents and, knowing the chemical formula and the density, allow the computation of dielectric function, reflectivity, and other optical functions. The “Henke reflectivity” can be used over photon energies of 10 eV to 34 keV, after which a 1/ω4 continuation is perfectly fine. The bridge between experimental data and the Henke reflectivity as well as two corrections made to the latter are discussed.

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  • Received 4 November 2014
  • Revised 6 January 2015

DOI:https://doi.org/10.1103/PhysRevB.91.035123

©2015 American Physical Society

Authors & Affiliations

D. B. Tanner

  • Department of Physics, University of Florida, Gainesville, Florida 32611, USA

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Vol. 91, Iss. 3 — 15 January 2015

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