Heterogeneity-induced defect bifurcation and pulse dynamics for a three-component reaction-diffusion system

Xiaohui Yuan, Takashi Teramoto, and Yasumasa Nishiura
Phys. Rev. E 75, 036220 – Published 27 March 2007

Abstract

We consider the dynamics when traveling pulses encounter heterogeneities in a three-component reaction diffusion system of one-activator–two-inhibitor type, which typically arises as a qualitative model of a gas-discharge system. We focused on the case where one of the kinetic coefficients changes similar to a smoothed step function, which is basic for more general heterogeneity as in periodic or random media. Since the heterogeneity is introduced to the kinetic part in an additive way, it causes the system to produce various types of localized structures smoothing the jump heterogeneity called the defects at the jump point, which makes a sharp contrast with the multiplicative heterogeneous case for the Gray-Scott model. The main issue is to study the collision dynamics between traveling pulses and defects, and show that their global bifurcation structure plays a key role in clarifying the underlying mechanism. Five outputs are observed after collisions including annihilation, rebound, and pinning. Unstable steady states are identified as separators between two different dynamic regimes: penetration and rebound, the role of which is very close to that of scattors arising in collision process. An organizing center producing the traveling pulses, defects, and scattors via unfolding with respect to the parameters is also presented.

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  • Received 24 November 2006

DOI:https://doi.org/10.1103/PhysRevE.75.036220

©2007 American Physical Society

Authors & Affiliations

Xiaohui Yuan

  • Department of Mathematics and Research Institute for Electronic Science, Hokkaido University, Sapporo 060-0813, Japan

Takashi Teramoto

  • Department of Photonics Material Science, Faculty of Photonics Science, Chitose Institute of Science and Technology, Chitose 066-8655 Japan

Yasumasa Nishiura*

  • Research Institute for Electronic Science, Hokkaido University, Sapporo 060-0813, Japan

  • *Electronic address: nishiura@aurora.es.hokudai.ac.jp

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Vol. 75, Iss. 3 — March 2007

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