Ubiquitous Mechanisms of Energy Dissipation in Noncontact Atomic Force Microscopy

S. Alireza Ghasemi, Stefan Goedecker, Alexis Baratoff, Thomas Lenosky, Ernst Meyer, and Hans J. Hug
Phys. Rev. Lett. 100, 236106 – Published 13 June 2008

Abstract

Atomistic simulations considering larger tip structures than hitherto assumed reveal novel dissipation mechanisms in noncontact atomic force microscopy. The potential energy surfaces of realistic silicon tips exhibit many energetically close local minima that correspond to different structures. Most of them easily deform, thus causing dissipation arising from hysteresis in force versus distance characteristics. Furthermore, saddle points which connect local minima can suddenly switch to connect different minima. Configurations driven into metastability by the tip motion can thus suddenly access lower energy structures when thermal activation becomes allowed within the time required to detect the resulting average dissipation.

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  • Received 18 February 2008

DOI:https://doi.org/10.1103/PhysRevLett.100.236106

©2008 American Physical Society

Authors & Affiliations

S. Alireza Ghasemi1, Stefan Goedecker1, Alexis Baratoff1, Thomas Lenosky2, Ernst Meyer1, and Hans J. Hug1,3

  • 1Department of Physics and National Center for Research in Nanoscale Science, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland
  • 2Department of Materials Science and Engineering, Ohio State University, Columbus, Ohio 43210, USA
  • 3Swiss Federal Laboratory for Materials Testing and Research, 8600 Dubendorf, Switzerland

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Issue

Vol. 100, Iss. 23 — 13 June 2008

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