Transferability of Phase Shifts in Extended X-Ray Absorption Fine Structure

P. H. Citrin, P. Eisenberger, and B. M. Kincaid
Phys. Rev. Lett. 36, 1346 – Published 31 May 1976
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Abstract

Phase shifts in extended x-ray-absorption fine-structure (EXAFS) measurements have been empirically determined for atom pairs. For photoelectron energies > 100 eV it is shown that these phase shifts, because they are essentially independent of chemical environment, can be used with EXAFS spectra to determine interatomic distances typically to accuracies of 0.02 Å.

  • Received 14 January 1976

DOI:https://doi.org/10.1103/PhysRevLett.36.1346

©1976 American Physical Society

Authors & Affiliations

P. H. Citrin, P. Eisenberger, and B. M. Kincaid

  • Bell Laboratories, Murray Hill, New Jersey 07974

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Issue

Vol. 36, Iss. 22 — 31 May 1976

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