Unified Mechanism for Schottky-Barrier Formation and III-V Oxide Interface States

W. E. Spicer, I. Lindau, P. Skeath, C. Y. Su, and Patrick Chye
Phys. Rev. Lett. 44, 420 – Published 11 February 1980
PDFExport Citation

Abstract

Extensive experimental evidence indicates that the Schottky-barrier formation on III-V semiconductors is due to defects formed near the interface by deposition of the metal (or of oxygen). Detailed level positions are established and assigned to either missing column III or V atoms. This model also applies to formation of states at III-V oxide interface states.

  • Received 5 September 1979

DOI:https://doi.org/10.1103/PhysRevLett.44.420

©1980 American Physical Society

Authors & Affiliations

W. E. Spicer, I. Lindau, P. Skeath, C. Y. Su, and Patrick Chye*

  • Stanford Electronics Laboratories, Stanford University, Stanford, California 94305

  • *Present address: IBM, Fishkill, N. Y. 12524.

References (Subscription Required)

Click to Expand
Issue

Vol. 44, Iss. 6 — 11 February 1980

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×