Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions

M. G. Blain; S. Della-Negra; H. Joret; Y. Le Beyec; E. A. Schweikert

doi:10.1103/PhysRevLett.63.1625

Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions

M. G. Blain, S. Della-Negra, H. Joret, Y. Le Beyec, and E. A. Schweikert

Phys. Rev. Lett. 63, 1625 – Published 9 October 1989

Abstract

We have measured negative secondary-ion yields from phenylalanine, CsI, and Au bombarded by complex ions of 5–28 keV. The primary ions were organic monomer and dimer ions and clusters of CsI. Large enhancements occur in the measured secondary-ion yields for more complex projectiles. We show that secondary-ion yields of ${Au}^{-}$ atomic species are related to the square of the projectile momentum.

Received 2 June 1989

DOI:https://doi.org/10.1103/PhysRevLett.63.1625

Authors & Affiliations

M. G. Blain, S. Della-Negra, H. Joret, Y. Le Beyec, and E. A. Schweikert

Institut de Physique Nucléaire, 91406 Orsay CEDEX, France and Center for Chemical Characterization, Texas A&M University, College Station, Texas 77843