Mechanism of internal gettering of interstitial impurities in Czochralski-grown silicon

Dieter Gilles, Eicke R. Weber, and SooKap Hahn
Phys. Rev. Lett. 64, 196 – Published 8 January 1990
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Abstract

Results of the low-temperature precipitation of interstitial Fe (≊250 °C) in Czochralski-grown Si after different annealing treatments for the precipitation of oxygen are presented. It is concluded that the Fe solubility is not affected by the oxygen-precipitation process. The Fe-precipitation kinetics are found to be strongly accelerated by oxygen-precipitationinduced defects. Based on the results the mechanism of internal gettering is derived. For the first time the contribution of oxygen precipitates and dislocations to the internal-gettering process have been determined quantitatively.

  • Received 16 October 1989

DOI:https://doi.org/10.1103/PhysRevLett.64.196

©1990 American Physical Society

Authors & Affiliations

Dieter Gilles and Eicke R. Weber

  • Department of Materials Science and Mineral Engineering, University of California, Berkeley, California 94720

SooKap Hahn

  • Siltec Silicon Incorporated, Menlo Park, California 94025

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Vol. 64, Iss. 2 — 8 January 1990

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