Abstract
Magnetic-field and temperature dependence of the critical current density is investigated in epitaxial thin films. For the magnetic field H applied parallel to the c axis, the flux pinning force density (=B) exhibits clear scaling behavior when H is normalized by the irreversibility field . The maximum pinning force density scales linearly with . This is the first observed scaling of in high-quality thin films of Bi oxides, which we can reasonably explain with flux-creep theory by assuming that the activation energy is proportional to the flux line spacing.
- Received 16 November 1992
DOI:https://doi.org/10.1103/PhysRevLett.70.3331
©1993 American Physical Society