Direct imaging of surface cusp evolution during strained-layer epitaxy and implications for strain relaxation

D. E. Jesson; S. J. Pennycook; J.-M. Baribeau; D. C. Houghton

doi:10.1103/PhysRevLett.71.1744

Direct imaging of surface cusp evolution during strained-layer epitaxy and implications for strain relaxation

D. E. Jesson, S. J. Pennycook, J.-M. Baribeau, and D. C. Houghton

Phys. Rev. Lett. 71, 1744 – Published 13 September 1993

Abstract

We have directly imaged the evolution of surface cusps during strained-layer epitaxy. The cusps arise naturally as a result of gradients in the surface chemical potential. High stress concentrations at the cusp tip have important implications for strain relaxation in the film via dislocation nucleation.