Surface Layering in Liquid Gallium: An X-Ray Reflectivity Study

M. J. Regan, E. H. Kawamoto, S. Lee, P. S. Pershan, N. Maskil, M. Deutsch, O. M. Magnussen, B. M. Ocko, and L. E. Berman
Phys. Rev. Lett. 75, 2498 – Published 25 September 1995
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Abstract

Surface-induced atomic layering in liquid gallium has been observed using x-ray reflectivity, ultrahigh vacuum conditions, and sputtered clean surfaces. Reflectivity data, collected on a supercooled liquid sample to momentum transfers as large as qz=3.01, exhibit a strong maximum near 2.4 Å 1 indicating a layer spacing that is comparable to its atomic dimensions. The amplitude of the electron density oscillations decays with a characteristic length of 6 Å. This is unexpectedly twice that of recent results for Hg, and the difference may be related to covalent bonding or supercooling.

  • Received 10 March 1995

DOI:https://doi.org/10.1103/PhysRevLett.75.2498

©1995 American Physical Society

Authors & Affiliations

M. J. Regan, E. H. Kawamoto, S. Lee, and P. S. Pershan

  • Division of Applied Sciences and Department of Physics, Harvard University, Cambridge, Massachusetts 02138

N. Maskil and M. Deutsch

  • Department of Physics, Bar-Ilan University, Ramat-Gan 52100, Israel

O. M. Magnussen and B. M. Ocko

  • Department of Physics, Brookhaven National Laboratory, Upton, New York 11973

L. E. Berman

  • National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973

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Issue

Vol. 75, Iss. 13 — 25 September 1995

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