Dopant Segregation at Semiconductor Grain Boundaries through Cooperative Chemical Rebonding

A. Maiti, M. F. Chisholm, S. J. Pennycook, and S. T. Pantelides
Phys. Rev. Lett. 77, 1306 – Published 12 August 1996
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Abstract

Recent theoretical work found that isolated As impurities in Ge grain boundaries exhibit minimal binding, leading to the suggestion that the observed segregation is likely to occur at defects and steps. We report ab initio calculations for As in Si and show that segregation is possible at defect-free boundaries through the cooperative incorporation of As in threefold-coordinated configurations: As dimers, or ordered chains of either As atoms or As dimers along the grain boundary dislocation cores. Finally, we find that As segregation may drive structural transformations of certain grain boundaries.

  • Received 25 March 1996

DOI:https://doi.org/10.1103/PhysRevLett.77.1306

©1996 American Physical Society

Authors & Affiliations

A. Maiti1,2, M. F. Chisholm1, S. J. Pennycook1, and S. T. Pantelides1,2

  • 1Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
  • 2Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235

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Vol. 77, Iss. 7 — 12 August 1996

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