Trap-Limited Electronic Transport in Assemblies of Nanometer-Size Ti<span class="aps-inline-formula"><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><mrow><msub><mrow><mi mathvariant="normal">O</mi></mrow><mrow><mn>2</mn></mrow></msub></mrow></math></span> Particles

P. E. de Jongh; D. Vanmaekelbergh

doi:10.1103/PhysRevLett.77.3427

Trap-Limited Electronic Transport in Assemblies of Nanometer-Size Ti $O_{2}$ Particles

P. E. de Jongh and D. Vanmaekelbergh

Phys. Rev. Lett. 77, 3427 – Published 14 October 1996

Abstract

The characteristics of the transport of photogenerated electrons through electrodes consisting of nanometer-size Ti $O_{2}$ particles were investigated by intensity modulated photocurrent spectroscopy. Electronic transport is controlled by trapping and detrapping of photogenerated electrons in interfacial bandgap states, distributed in energy. The localization time of a trapped electron is controlled by the steady-state light intensity and interfacial kinetics.