Computer Simulation Study of the Wetting Behavior and Line Tensions of Nanometer Size Particulates at a Liquid-Vapor Interface

Fernando Bresme and Nicholas Quirke
Phys. Rev. Lett. 80, 3791 – Published 27 April 1998
PDFExport Citation

Abstract

We study the behavior of nanometer size particulates at a liquid-vapor interface by means of molecular dynamics simulations. We propose a methodology for computing the line tension using computer simulations, and present new data for the wetting of particulates at a planar liquid-vapor interface, as a function of particulate size. For the sizes considered in this work the line tension is negative and influences the wetting behavior of particulates at the liquid-vapor interface.

  • Received 25 September 1997

DOI:https://doi.org/10.1103/PhysRevLett.80.3791

©1998 American Physical Society

Authors & Affiliations

Fernando Bresme and Nicholas Quirke

  • Centre for Computational Chemistry, Department of Chemistry, University of Wales at Bangor, Bangor, Gwynedd, LL57 2UW, United Kingdom

References (Subscription Required)

Click to Expand
Issue

Vol. 80, Iss. 17 — 27 April 1998

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×