Abstract
We study the behavior of nanometer size particulates at a liquid-vapor interface by means of molecular dynamics simulations. We propose a methodology for computing the line tension using computer simulations, and present new data for the wetting of particulates at a planar liquid-vapor interface, as a function of particulate size. For the sizes considered in this work the line tension is negative and influences the wetting behavior of particulates at the liquid-vapor interface.
- Received 25 September 1997
DOI:https://doi.org/10.1103/PhysRevLett.80.3791
©1998 American Physical Society