Determination of Atomic Positions in a Solid Xe Precipitate Embedded in an Al Matrix

K. Mitsuishi, M. Kawasaki, M. Takeguchi, and K. Furuya
Phys. Rev. Lett. 82, 3082 – Published 12 April 1999
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Abstract

The atomic structure of precipitates embedded in crystalline membranes was observed for the first time by high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) with an electron probe in an atomic dimension. The experimental image was analyzed by taking a line profile and was compared with the calculated intensities obtained from the multislice based HAADF-STEM simulation. A model shifting Xe atoms slightly from the on-site of the Al matrix in the [100] direction agreed well with the experimental profile and image. From these results, the small displacement of Xe atoms to the Al matrix is estimated at about 0.5 Å.

  • Received 9 November 1998

DOI:https://doi.org/10.1103/PhysRevLett.82.3082

©1999 American Physical Society

Authors & Affiliations

K. Mitsuishi

  • National Research Institute for Metals, Sakura, Tsukuba 305, Japan

M. Kawasaki

  • JEOL Ltd., Akishima, Tokyo 196, Japan

M. Takeguchi and K. Furuya

  • National Research Institute for Metals, Sakura, Tsukuba 305, Japan

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Vol. 82, Iss. 15 — 12 April 1999

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