Quasicrystalline d-AlCuCo Identified as Random Tiling by Ion Channeling Combined with Particle-Induced X-Ray Emission

Gabriele Zeger, Dieter Plachke, Heinz Dieter Carstanjen, and Hans-Rainer Trebin
Phys. Rev. Lett. 82, 5273 – Published 28 June 1999
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Abstract

In a model quasicrystal for decagonal AlCuCo the phason disorder was gradually increased and the channeling particle-induced x-ray emission (PIXE) yields were computed for 3 MeV He ions by Monte Carlo simulations. For large phason disorder good agreement with experimental data was obtained. Thus we conclude that the sample of d-AlCuCo used in the measurements is a random tiling. One remaining discrepancy, namely, that the PIXE yields of the simulations are approximately the same for Cu and Co, is eliminated by optimization of the Cu and Co positions.

  • Received 2 July 1998

DOI:https://doi.org/10.1103/PhysRevLett.82.5273

©1999 American Physical Society

Authors & Affiliations

Gabriele Zeger1, Dieter Plachke1,2, Heinz Dieter Carstanjen1,2, and Hans-Rainer Trebin1

  • 1Institut für Theoretische und Angewandte Physik, Universität Stuttgart, Pfaffenwaldring 57, D-70550 Stuttgart, Germany
  • 2Max-Planck-Institut für Metallforschung, Heisenbergstrasse 1, D-70569 Stuttgart, Germany

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Vol. 82, Iss. 26 — 28 June 1999

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