Electronic Transport in Y-Junction Carbon Nanotubes

C. Papadopoulos, A. Rakitin, J. Li, A. S. Vedeneev, and J. M. Xu
Phys. Rev. Lett. 85, 3476 – Published 16 October 2000
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Abstract

Electronic transport measurements were performed on Y-junction carbon nanotubes. These novel junctions contain a large diameter tube branched into smaller ones. Independent measurements using good quality contacts on both individual Y junctions and many in parallel show intrinsic nonlinear transport and reproducible rectifying behavior at room temperature. The results were modeled using classic interface physics for a junction with an abrupt change in band gap due to the change in tube diameter. These Y-junction tubes represent new heterojunctions for nanoelectronics.

  • Received 22 February 2000

DOI:https://doi.org/10.1103/PhysRevLett.85.3476

©2000 American Physical Society

Authors & Affiliations

C. Papadopoulos1, A. Rakitin1, J. Li1, A. S. Vedeneev1,2, and J. M. Xu1,3

  • 1Department of Electrical & Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, Canada M5S 3G4
  • 2Russian Academy of Sciences, Institute of Radioengineering and Electronics, Fryazino, Moscow district 141120, Russia
  • 3Division of Engineering, Brown University, Providence, Rhode Island 02912

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Vol. 85, Iss. 16 — 16 October 2000

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