Mobility of the Doped Holes and the Antiferromagnetic Correlations in Underdoped High- Tc Cuprates

Yoichi Ando, A. N. Lavrov, Seiki Komiya, Kouji Segawa, and X. F. Sun
Phys. Rev. Lett. 87, 017001 – Published 12 June 2001
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Abstract

The emergence and the evolution of the metallic charge transport in the La2xSrxCuO4 system from lightly to optimally doped samples ( x=0.010.17) are studied. We demonstrate that in high-quality single crystals the in-plane resistivity shows a metallic behavior for all values of x at moderate temperatures and that the hole mobility at 300 K changes only by a factor of 3 from x=0.01 to 0.17, where its x dependence is found to be intriguingly similar to that of the inverse antiferromagnetic correlation length. We discuss an incoherent-metal picture and a charged-stripe scenario as candidates to account for these peculiar features.

  • Received 22 January 2001

DOI:https://doi.org/10.1103/PhysRevLett.87.017001

©2001 American Physical Society

Authors & Affiliations

Yoichi Ando, A. N. Lavrov, Seiki Komiya, Kouji Segawa, and X. F. Sun

  • Central Research Institute of Electric Power Industry, Komae, Tokyo 201-8511, Japan

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Vol. 87, Iss. 1 — 2 July 2001

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