Figure 1

Dewetting morphologies observed in various liquid polystyrene films beading off a silicon substrate. The height has been normalized with respect to the film thickness. (a) Profiles of the rims of holes nucleated in 40 nm thick films. The steep profile was obtained with a molecular weight of $M_W\mathrm{=}101\mathrm{k}\mathrm{g}/\mathrm{m}\mathrm{o}\mathrm{l}$, the flatter profile with $M_W\mathrm{=}600\mathrm{k}\mathrm{g}/\mathrm{m}\mathrm{o}\mathrm{l}$. Each profile is superimposed with a double exponential fit as a dotted line; the agreement is almost perfect (see text). (b) Profile obtained with $M_W\mathrm{=}2\mathrm{k}\mathrm{g}/\mathrm{m}\mathrm{o}\mathrm{l}$ ($h=4.9\mathrm{n}\mathrm{m}$). (c) Same as (b), but with smaller film thickness ($h=3.9\mathrm{n}\mathrm{m}$).Reuse & Permissions

Figure 2

(a) Morphological phase diagram for viscoelastic dewetting fronts in the $(\tilde{E},\tilde{v})$ plane, according to Eq. (6). (b) Deviation of the phase boundary according to Eq. (5) (solid curve) from the approximation given by Eq. (6) (dashed line).Reuse & Permissions