Quenched Disorder and the Critical Behavior of a Partially Frustrated System

A. Perumal, V. Srinivas, V. V. Rao, and R. A. Dunlap
Phys. Rev. Lett. 91, 137202 – Published 23 September 2003

Abstract

We report the direct observation of the effects of quenched disorder on the critical behavior of partially frustrated amorphous FeMnZr alloys by the systematic analysis of high-precision ac susceptibility data and dc magnetization data. Interestingly, the analysis reveals that the presence of short-range quenched disorder does not alter the actual critical behavior. However, it does affect quantities such as the Curie temperature, the peak value of effective exponent γ, width of the peak, and crossover temperatures. The observed temperature dependence of the effective critical exponent can be understood in terms of the field-theoretical renormalization group approach. Also, the present results would help in identifying the main source of the spread in the exponent values reported in the literature.

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  • Received 17 May 2003

DOI:https://doi.org/10.1103/PhysRevLett.91.137202

©2003 American Physical Society

Authors & Affiliations

A. Perumal* and V. Srinivas

  • Department of Physics, Indian Institute of Technology, Kharagpur 721302, India

V. V. Rao

  • Cryogenic Engineering Center, Indian Institute of Technology, Kharagpur 721302, India

R. A. Dunlap

  • Department of Physics, Dalhousie University, Nova Scotia, Canada B3H 3J5

  • *Present address: Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea.
  • Electronic address: veeturi@phy.iitkgp.ernet.in

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Issue

Vol. 91, Iss. 13 — 26 September 2003

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