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Two-Dimensional Mapping of Chemical Information at Atomic Resolution

M. Bosman, V. J. Keast, J. L. García-Muñoz, A. J. D’Alfonso, S. D. Findlay, and L. J. Allen
Phys. Rev. Lett. 99, 086102 – Published 22 August 2007

Abstract

The simultaneous measurement of structural and chemical information at the atomic scale provides fundamental insights into the connection between form and function in materials science and nanotechnology. We demonstrate structural and chemical mapping in Bi0.5Sr0.5MnO3 using an aberration-corrected scanning transmission electron microscope. Two-dimensional mapping is made possible by an adapted method for fast acquisition of electron energy-loss spectra. The experimental data are supported by simulations, which help to explain the less intuitive features.

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  • Received 8 June 2007

DOI:https://doi.org/10.1103/PhysRevLett.99.086102

©2007 American Physical Society

Authors & Affiliations

M. Bosman1, V. J. Keast2,*, J. L. García-Muñoz3, A. J. D’Alfonso4, S. D. Findlay4, and L. J. Allen4

  • 1Electron Microscope Unit, The University of Sydney, NSW 2006, Australia
  • 2School of Mathematical and Physical Sciences, The University of Newcastle, Callaghan, NSW 2308, Australia
  • 3Institut de Ciència de Materials de Barcelona, CSIC, Campus Universitari de Bellaterra, E-08193 Bellaterra, Spain
  • 4School of Physics, University of Melbourne, Victoria 3010, Australia

  • *vicki.keast@newcastle.edu.au

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Issue

Vol. 99, Iss. 8 — 24 August 2007

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