In Situ Real-Time Observation of Thin Film Deposition: Roughening, Zeno Effect, Grain Boundary Crossing Barrier, and Steering

M. J. Rost
Phys. Rev. Lett. 99, 266101 – Published 27 December 2007
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Abstract

We report on the first atomic-scale real-time in situ investigation of the growth of a polycrystalline gold film during its deposition performed with a scanning tunneling microscope. Continuously scanning while depositing the film enables the direct observation of atomic processes. The grain boundaries play a crucial role in the evolving film structure, as they initiate mound formation, thereby significantly increasing the film roughness. A possible additional roughness increase comes from atom steering, which also can delay the film closure in the early stages during film growth.

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  • Received 22 June 2007

DOI:https://doi.org/10.1103/PhysRevLett.99.266101

©2007 American Physical Society

Authors & Affiliations

M. J. Rost

  • Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands

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Issue

Vol. 99, Iss. 26 — 31 December 2007

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