Electronic properties of chemically doped graphene

Frédéric Joucken, Luc Henrard, and Jérôme Lagoute
Phys. Rev. Materials 3, 110301 – Published 8 November 2019

Abstract

Chemical doping of graphene is the most robust way of modifying graphene's electronic properties. We review here the results obtained so far on the electronic structure and transport properties of chemically doped graphene, focusing on the results obtained with scanning tunneling microscopy/spectroscopy (STM/S), angle-resolved photoemission spectroscopy (ARPES), and magnetoresistance measurements. The majority of the results reported have been obtained on nitrogen-doped samples, but boron-doped graphene has also been well documented. Aside from the appearance of the dopant on STM topographic images, the main questions that have been addressed are the atomic configurations of the doping and their doping efficiency (number of electrons/holes brought to the graphene lattice). Both can be addressed by a local probe such as STM/S. The doping efficiency has also been complementarily studied via direct visualization of the band structure with ARPES. The effect of the dopants on the electronic transport properties and in particular their influence on the scattering mechanisms is also presented. Finally, avenues for future research efforts are suggested.

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  • Received 17 July 2019

DOI:https://doi.org/10.1103/PhysRevMaterials.3.110301

©2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Frédéric Joucken1,*, Luc Henrard2, and Jérôme Lagoute3

  • 1Department of Physics, University of California, Santa Cruz, California 95064, USA
  • 2Department of Physics and Namur Institute of Structured Materials, University of Namur, Rue de Bruxelles 51, 5000 Namur, Belgium
  • 3Laboratoire Matériaux et Phénomènes Quantiques, UMR7162, Université Paris Diderot Paris 7, Sorbonne Paris Cité, CNRS, UMR 7162, Case courrier 7021, 75205 Paris 13, France

  • *frederic.joucken@gmail.com

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Issue

Vol. 3, Iss. 11 — November 2019

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