Interplay between topological insulators and superconductors

Jian Wang, Cui-Zu Chang, Handong Li, Ke He, Duming Zhang, Meenakshi Singh, Xu-Cun Ma, Nitin Samarth, Maohai Xie, Qi-Kun Xue, and M. H. W. Chan
Phys. Rev. B 85, 045415 – Published 10 January 2012

Abstract

Topological insulators are insulating in the bulk but possess metallic surface states protected by time-reversal symmetry. Here, we report on a detailed electronic transport study in high-quality Bi2Se3 topological insulator thin films contacted by superconducting (In, Al, and W) electrodes. The resistance of the film shows an abrupt and significant upturn when the electrodes become superconducting. In turn, the Bi2Se3 film greatly weakens the superconductivity of the electrodes, significantly reducing both their transition temperatures and their critical fields. A possible interpretation of these results is that the superconducting electrodes are accessing the surface states and the experimental results are consequences of the interplay between the Cooper pairs of the electrodes and the spin-polarized current of the surface states in Bi2Se3.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 14 December 2011

DOI:https://doi.org/10.1103/PhysRevB.85.045415

©2012 American Physical Society

Authors & Affiliations

Jian Wang1,2,*, Cui-Zu Chang3,4, Handong Li5,6, Ke He3, Duming Zhang1, Meenakshi Singh1, Xu-Cun Ma3, Nitin Samarth1, Maohai Xie5, Qi-Kun Xue3,4, and M. H. W. Chan1,†

  • 1Center for Nanoscale Science and Department of Physics, Pennsylvania State University, University Park, Pennsylvania 16802-6300, USA
  • 2International Center for Quantum Materials and State Key Laboratory for Mesoscopic Physics, School of Physics, Peking University, Beijing, 100871, China
  • 3Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
  • 4Department of Physics, Tsinghua University, Beijing 100084, China
  • 5Physics Department, University of Hong Kong, Pokfulam Road, Hong Kong, China
  • 6State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, China

  • *jianwangphysics@pku.edu.cn
  • chan@phys.psu.edu

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 85, Iss. 4 — 15 January 2012

Reuse & Permissions
Access Options
CHORUS

Article Available via CHORUS

Download Accepted Manuscript
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×